The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jun. 28, 2018
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Ralph Lange, Jena, DE;

Rebecca Elsässer, Jena, DE;

Harald Schadwinkel, Hannover, DE;

Emmanuel G. Reynaud, Blackrock, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/00 (2006.01); G01N 21/13 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/26 (2013.01); G01N 21/13 (2013.01); G02B 21/34 (2013.01);
Abstract

An adapter is useful with a sample holder of a microscope. The adapter has at least one support region for reproducibly orienting the adapter in a mounted state in a sample holder support. The adapter also has a first coupling point for detachable connection to a coupling structure of a sample holder on one side, and a second coupling point for detachable connection to a coupling structure of a sample manipulator on a side of the adapter opposite to the first coupling point. The adapter is useful with the sample holder, a sample chamber, a microscope and a method for arranging a sample in a detection beam path of a microscope.


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