The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Nov. 30, 2020
Applicant:

Abberior Instruments Gmbh, Goettingen, DE;

Inventors:

Joern Heine, Witzenhausen, DE;

Haugen Mittelstaedt, Bovenden, DE;

Matthias Reuss, Goettingen, DE;

Gerald Donnert, Goettingen, DE;

Assignee:

ABBERIOR INSTRUMENTS GMBH, Goettingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6458 (2013.01); G02B 21/361 (2013.01);
Abstract

A fluorescence microscope () includes a sample illumination beam path including a source () for illumination light, a first wave front modulator () for providing the focused illumination light () with a central intensity minimum, a beam splitter () and a second adjustable wave front modulator () arranged in a pupil plane () of an objective (). A first detection beam path section including the second wave front modulator () and a telescope () and ending at the beam splitter () coincides with the sample illumination beam path. A separate second detection beam path section includes a detector () for luminescence light from a sample. The telescope () images a first pupil () formed in the pupil plane () in a smaller second pupil (), and transfers a beam of the illumination light () collimated in the second pupil () into an expanded beam collimated in the first pupil ().


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