The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Mar. 14, 2022
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Shinji Morimoto, Kanagawa, JP;

Motohiro Banno, Kanagawa, JP;

Taichi Murakami, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/18 (2006.01); G02B 27/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/021 (2013.01); G01J 3/0208 (2013.01); G01J 3/0216 (2013.01); G02B 27/283 (2013.01);
Abstract

An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.


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