The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Oct. 29, 2018
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

He Luan, Palo Alto, CA (US);

Jun Zeng, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 50/02 (2015.01); B29C 64/209 (2017.01); B29C 64/165 (2017.01); G06N 3/04 (2006.01); G06T 7/00 (2017.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/165 (2017.08); B29C 64/209 (2017.08); G06N 3/04 (2013.01); G06T 7/0004 (2013.01); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G06T 2207/10048 (2013.01);
Abstract

Examples of methods for monitoring additive manufacturing by an electronic device are described herein. In some examples, a predicted thermal image is calculated for a layer. In some examples, a captured thermal image is obtained for the layer. In some examples, a risk score is calculated for the layer based on the predicted thermal image and the captured thermal image. In some examples, a mitigation operation is performed in response to determining that the risk score is outside of a threshold range.


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