The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Mar. 26, 2021
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Ayon Chakraborty, Plainsboro, NJ (US);
Karthikeyan Sundaresan, Manalapan, NJ (US);
Sampath Rangarajan, Bridgewater, NJ (US);
Md. Shaifur Rahman, Plainsboro, NJ (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04W 74/00 (2009.01); B64C 39/02 (2023.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
H04W 64/003 (2013.01); B64C 39/024 (2013.01); G06T 19/006 (2013.01); H04W 74/002 (2013.01); B64C 2201/122 (2013.01); H04W 64/00 (2013.01);
Abstract
Methods and systems for localization within an environment include determining a topology estimate of nodes located in a dynamic indoor environment, based on distances measured between the nodes. Rigid k-core sub-graphs of the topology estimate are generated to determine relative localizations of the nodes. Relative localizations are transformed into absolute localizations to generate a map of positions of the nodes within the environment. A feature of the map is deployed to a device in the environment.