The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Jul. 17, 2018
Applicant:

The Institute of Optics and Electronics, the Chinese Academy of Sciences, Sichuan, CN;

Inventors:

Xiangang Luo, Sichuan, CN;

Mingbo Pu, Sichuan, CN;

Xiong Li, Sichuan, CN;

Xiaoliang Ma, Sichuan, CN;

Guoqing Shen, Sichuan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/00 (2006.01); G02B 5/02 (2006.01); F41H 3/00 (2006.01); H01Q 15/00 (2006.01); H01Q 15/14 (2006.01); H01Q 17/00 (2006.01); G02B 5/00 (2006.01);
U.S. Cl.
CPC ...
G02B 5/0284 (2013.01); G02B 1/002 (2013.01); G02B 5/003 (2013.01); G02B 5/0215 (2013.01); H01Q 15/0026 (2013.01); H01Q 17/00 (2013.01); F41H 3/00 (2013.01); G02B 5/0294 (2013.01); H01Q 15/142 (2013.01);
Abstract

The present disclosure provides a sub-wavelength structural material having compatibility of low detectability for infrared, laser, and microwave, which includes, from top to bottom, a metal type frequency selective surface layer I, a dielectric layer I, a metal type frequency selective surface layer II, a dielectric layer II, a resistive film, a dielectric layer III. Each of the metal type frequency selective surface layers is a sub-wavelength patch type array, and metal used by the metal type frequency selective surface layers has a characteristic of low infrared emissivity. The present disclosure modulates a phase by using a phase difference generated by patches with different sizes on the metal type frequency selective surface layer I, so as to control backscattering of incident electromagnetic waves to achieve compatibility of low detectability for laser and infrared, while the bottom three layers achieve absorption of microwave.


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