The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Dec. 28, 2018
Avl List Gmbh, Graz, AT;
Raja Sangili Vadamalu, Darmstadt, DE;
Christian Beidl, Eggersdorf, AT;
Maximilian Bier, Darmstadt, DE;
Abstract
To improve the identification of system parameters of a test setup of a test bench there is provision for the test setup to be dynamically excited on the test bench by virtue of a dynamic input signal being applied to the test setup. Measured values of the input signal of the test setup and of a resultant output signal of the test setup are recorded. A frequency response of the dynamic response of the test setup between the output signal and the input signal is determined using a nonparametric identification method. A model structure of a parametric model that maps the input signal onto the output signal is derived from the frequency response. The model structure and a parametric identification method are used to determine at least one system parameter of the test setup, and the at least one identified system parameter is used to perform the test run.