The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Aug. 04, 2021
Applicant:

Faraday Technology Corp., Hsinchu, TW;

Inventors:

Jing-Zhi Gao, Hsinchu, TW;

Yu-Hsin Tseng, Hsinchu, TW;

Yung-Sung Chang, Hsinchu, TW;

Zhi-Xin Lin, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0016 (2013.01); H04L 7/0079 (2013.01);
Abstract

A clock data calibration circuit including a first comparator, a multi-phase clock generator, a plurality of samplers, a plurality of data comparators and a data selector is provided. The first comparator compares first input data with second input data to generate a data signal. The multi-phase clock generator generates a plurality of clock signals, and the clock signals are divided into a plurality of clock groups. The sampler samples the data signal according to the clock groups to respectively generate a plurality of first sampled data signal groups. The data comparators respectively sample the first sampled data signal groups according to selected clocks to generate a plurality of second sampled data signal groups. Each data comparator generates a plurality of status flags according to a variation state of a plurality of second sampled data. The data selector generates a plurality of output data signals according to the status flags.


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