The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Dec. 16, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Chiaki Dono, Kanagawa, JP;

Chikara Kondo, Tokyo, JP;

Roman A. Royer, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/48 (2006.01); G11C 29/30 (2006.01); G11C 29/36 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G11C 29/30 (2013.01); G11C 29/36 (2013.01); G11C 29/48 (2013.01); G11C 2029/1208 (2013.01); G11C 2029/3602 (2013.01); G11C 2029/4402 (2013.01);
Abstract

Embodiments of the disclosure are drawn to apparatuses, systems, and methods for direct access hybrid testing. A memory device, such as a high bandwidth memory (HBM) may include direct access terminals. During a testing procedure, test instructions may be provided to the memory through the direct access terminals. The test instructions include a data pointer which is associated with one of a plurality of test patterns pre-loaded in the memory and an address. The selected test pattern may be written to, and subsequently read from, the memory cells associated with the address. The read test pattern may be compared to the selected test pattern to generate result information. The test patterns may be loaded to the memory, and the result information may be read out from the memory, in an operational mode different than the operational mode in which the test instructions are provided.


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