The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

May. 05, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Deepankar Pal, Salt Lake City, UT (US);

Zack Francis, Pittsburgh, PA (US);

Assignee:

Ansys, Inc., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/23 (2020.01); B29C 64/386 (2017.01); G06T 17/00 (2006.01); B22F 10/00 (2021.01); G06F 119/08 (2020.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
G06F 30/23 (2020.01); B22F 10/00 (2021.01); B29C 64/386 (2017.08); G06T 17/00 (2013.01); B22F 10/10 (2021.01); G06F 2119/08 (2020.01);
Abstract

A method for performing a thermal simulation of an additive manufacturing process that includes accessing a voxel model representing a representative system using one or more processors. The voxel model includes a first transition associated with a first group of one or more voxels transitioning between liquid and vapor, a second transition associated with a second group of one or more voxels transitioning between solid and liquid, a third transition associated with a third group of one or more voxels undergoing sinter, and a fourth transition associated with a fourth group of one or more voxels undergoing a solid state phase change. The method determines a flux imbalance metric based on a flux, a rate of change of the first transition, a rate of change of the second transition, a rate of change of the third transition, and a rate of change of the fourth transition. The method determines one or more temperatures for the representative system based on the flux imbalance metric.


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