The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Aug. 30, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Poorna Kale, Folsom, CA (US);

Christopher J. Bueb, Folsom, CA (US);

Ashok Sahoo, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 12/0246 (2013.01); G06F 2212/7205 (2013.01);
Abstract

A host system can be queried to determine whether new data has been received based on a first time interval. After completion of the first time interval, a determination can be made as to whether the new data has been received and whether a portion of the new data was not stored. In response to the portion of the new data not being stored, the host system can be queried to determine whether subsequent data has been received based on a second time interval where the second time interval is different from first time interval.


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