The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

May. 11, 2021
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Manuel Amthor, Jena, DE;

Daniel Haase, Zöllnitz, DE;

Markus Sticker, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06N 20/00 (2019.01); G06N 3/04 (2023.01); G06T 7/00 (2017.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G06K 9/6262 (2013.01); G06N 3/04 (2013.01); G06N 20/00 (2019.01); G06T 7/0012 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20084 (2013.01);
Abstract

In a method for processing microscope images, at least one microscope image is provided as input image for an image processing algorithm. An output image is created from the input image by means of the image processing algorithm. The creation of the output image comprises adding low-frequency components for representing solidity of image structures of the input image to the input image, wherein the low-frequency components at least depend on high-frequency components of these image structures and wherein high-frequency components are defined by a higher spatial frequency than low-frequency components. A corresponding computer program and microscope system are likewise described.


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