The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Aug. 07, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Benjamin Ting, Cupertino, CA (US);

Alon Shtepel, Pleasanton, CA (US);

Isaac Kim, San Jose, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G06F 30/33 (2020.01); G06F 13/16 (2006.01); G06F 12/14 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31907 (2013.01); G01R 31/31912 (2013.01); G06F 12/1433 (2013.01); G06F 13/1668 (2013.01); G06F 30/33 (2020.01);
Abstract

A method for performing verification and testing of a device under test (DUT) is described. The method includes receiving, by a processing device, inputs from a user regarding a hardware design for the DUT. The processing device presents cover group attribute suggestions to the user based on the hardware design and receives cover group information from the user corresponding to one or more cover group attributes of one or more cover groups based on the cover group attribute suggestions. Based on the cover group information, the processing device automatically generates verification code, including one or more cover group definitions.


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