The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Jul. 21, 2021
Synopsys, Inc., Mountain View, CA (US);
Ruifeng Guo, Hillsboro, OR (US);
Ting-Pu Tai, Hsinchu, TW;
Synopsys, Inc., Mountain View, CA (US);
Abstract
Systems and methods disclosed include receiving defect data from a test of a semiconductor device comprising a circuit, the circuit comprising a cell, the cell comprising a first input, a second input and an output, and modeling a first plurality of cell defect modes of the cell with a first multiple input transition cell fault model (MTCFM), the cell defect modes associated with a first signal transition on the first input, and a second signal transition on the second input or the output. Systems and method further include correlating the first plurality of cell defect modes to the defect data to produce a probability of each of the first plurality of cell defect modes matching the defect data, and providing, to a user, an indication of each of at least one of the first plurality of cell defect modes having the probability exceeding a defect probability threshold.