The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Mar. 06, 2020
Min-hung Chang, Taoyuan, TW;
Ching-lin Lee, Taoyuan, TW;
Chin-yuan Chang, Taoyuan, TW;
Cheng-hung Pan, Taoyuan, TW;
Mao-sheng Liu, Taoyuan, TW;
Tzu-tu Chao, Taoyuan, TW;
Min-Hung Chang, Taoyuan, TW;
Ching-Lin Lee, Taoyuan, TW;
Chin-Yuan Chang, Taoyuan, TW;
Cheng-Hung Pan, Taoyuan, TW;
Mao-Sheng Liu, Taoyuan, TW;
Tzu-Tu Chao, Taoyuan, TW;
CHROMA ATE INC., Taoyuan, TW;
Abstract
Herein disclosed are a method and a test probe for testing an electrical component. The electrical component comprises at least a first electrode and a second electrode. The method comprises the following steps: covering the first electrode with a first conducting flexible layer; driving a first electrode contact to electrically connect a first end of the first electrode contact with the first electrode via the first conducting flexible layer; covering the second electrode with a second conducting flexible layer; and driving a second electrode contact to electrically connect a second end of the second electrode contact with the second electrode via the second conducting flexible layer. The first conducting flexible layer is an anisotropic conductive film.