The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Mar. 06, 2020
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Toshiya Suzuki, Helsinki, FI;

Viljami J. Pore, Helsinki, FI;

Hannu Huotari, Helsinki, FI;

Assignee:

ASM IP HOLDING B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/32 (2006.01); H01L 21/02 (2006.01); C23C 16/40 (2006.01); C23C 16/44 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02126 (2013.01); C23C 16/325 (2013.01); C23C 16/401 (2013.01); C23C 16/4408 (2013.01); C23C 16/45536 (2013.01); H01L 21/0228 (2013.01); H01L 21/02208 (2013.01); H01L 21/02214 (2013.01); H01L 21/02274 (2013.01);
Abstract

Methods for depositing silicon oxycarbide (SiOC) thin films on a substrate in a reaction space are provided. The methods can include at least one plasma enhanced atomic layer deposition (PEALD) cycle including alternately and sequentially contacting the substrate with a silicon precursor that does not comprise nitrogen and a second reactant that does not include oxygen. In some embodiments the methods allow for the deposition of SiOC films having improved acid-based wet etch resistance.


Find Patent Forward Citations

Loading…