The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Apr. 28, 2022
Applicant:

Jmp Statistical Discovery Llc, Cary, NC (US);

Inventors:

Ryan Adam Lekivetz, Cary, NC (US);

Joseph Albert Morgan, Raleigh, NC (US);

Caleb Bridges King, Morrisville, NC (US);

Bradley Allen Jones, Cary, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/04847 (2022.01); G01N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/04847 (2013.01); G01N 3/02 (2013.01);
Abstract

A computing device receives a request for a design of a combinatorial test for a test system. The device receives a run indication of a total quantity of test cases for the design, a factor indication of a total quantity of factors, and/or a strength indication for a covering array. The device generates an updated design by: selecting test case(s) to remove from a first design; or adding test case(s) to the first design. The first design comprises a set of test cases that represent the covering array according to the strength indication. The updated design is constrained to the total quantity of test cases as indicated by the run indication. The device outputs a respective setting for each test condition for at least one test case of the updated design for testing the test system.


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