The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Jun. 28, 2019
The University of Tokyo, Tokyo, JP;
Mitutoyo Corporation, Kanagawa, JP;
Yutaka Ohtake, Tokyo, JP;
Tasuku Ito, Tokyo, JP;
Tomonori Goto, Kanagawa, JP;
Masato Kon, Kanagawa, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction.