The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Dec. 20, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Vincenzo Reina, Munich, DE;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/34 (2006.01); G06F 11/07 (2006.01); G11C 11/56 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G06F 11/076 (2013.01); G06F 11/0727 (2013.01); G11C 16/349 (2013.01); G11C 11/5628 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01);
Abstract

A memory device can dynamically select a voltage step size for programming (i.e., charging) memory cells. The memory device can increase the voltage step size to reduce programming time or decrease the voltage step size to reduce errors. The memory device can identify device conditions, such as temperature or amount of use (e.g., a count of program/erase cycles). The memory device can increase the voltage step size when the device conditions are less likely to cause errors (e.g., in a middle temperature range or below a threshold number of program/erase cycles) or can decrease the voltage step size when the device conditions are more likely to cause errors (e.g., in a high or low temperature range or above a threshold number of program/erase cycles).


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