The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Sep. 11, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Kayhan Kucukcakar, Los Altos, CA (US);

Han Young Koh, Fremont, CA (US);

Assignee:

ANSYS, INC., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/323 (2020.01); G06F 119/06 (2020.01);
U.S. Cl.
CPC ...
G06F 30/323 (2020.01); G06F 2119/06 (2020.01);
Abstract

Systems, machine readable media and methods are described for analyzing one or more physical systems using techniques that recognize patterns in underlying data and use the patterns to efficiently compute outputs using the patterns to reduce computations. The physical systems can be simulated with an estimation (e.g., an estimated power versus time waveform) that can be efficiently computed and then the estimation can be analyzed to detect patterns in the data. The detected patterns can each be analyzed with, in one embodiment, higher accuracy than the estimation to provide data that can be combined across multiple instances of each pattern to provide a higher accuracy evaluation of the system with a lower computational overhead.


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