The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
May. 24, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Joerg Siebenmorgen, Jena, DE;
Ralf Netz, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λ, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λa target phase function Δφ(x, y, λ) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφ(x, y, λ) is effective only for the corresponding wavelength λ. The target phase functions Δφare predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφ(x, y, λ). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λsuch that the predefined structure of the illumination light is generated in the region of the sample.