The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Aug. 21, 2018
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Naresh Satyan, Pasadena, CA (US);
George Rakuljic, Santa Monica, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G02B 26/12 (2006.01); G02B 27/09 (2006.01); G02B 27/30 (2006.01); G02B 27/48 (2006.01); G01S 7/4914 (2020.01); G01S 17/58 (2006.01); G01S 17/42 (2006.01); G01S 7/4911 (2020.01); G01S 17/34 (2020.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01S 7/4911 (2013.01); G01S 7/4914 (2013.01); G01S 17/34 (2020.01); G01S 17/42 (2013.01); G01S 17/58 (2013.01); G02B 26/12 (2013.01); G02B 27/0977 (2013.01); G02B 27/30 (2013.01); G02B 27/48 (2013.01);
Abstract
LIDAR systems, and methods of measuring a scene are disclosed. A laser source emits one or more optical beams. A scanning optical system scans the optical beams over a scene and captures reflections from the scene. A measurement subsystem independently measures the reflections from N subpixels within each scene pixel, where N is an integer greater than 1, and combines the measurements of the reflections from the N subpixels to determine range and/or range rate for the pixel.