The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Sep. 28, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Wenlong Li, Beijing, CN;

Yuri Shpalensky, Givataim, IL;

Alex Gendelman, Givatayim, IL;

Maria Bortman, Ashkelon, IL;

Asaf Shiloni, Tel Aviv, IL;

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); G06T 17/00 (2006.01); G06T 7/70 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); G06T 7/70 (2017.01); G06T 7/74 (2017.01); G06T 17/00 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30221 (2013.01); G06T 2219/2012 (2013.01);
Abstract

Methods and apparatus to generate photo-realistic three-dimensional models of a photographed environment are disclosed. An apparatus includes an object position calculator to determine a three-dimensional (3D) position of an object detected within a first image of an environment and within a second image of the environment. The apparatus further includes a 3D model generator to generate a 3D model of the environment based on the first image and the second image. The apparatus also includes a model integrity analyzer to detect a difference between the 3D position of the object and the 3D model. The 3D model generator automatically modifies the 3D model based on the difference in response to the difference satisfying a confidence threshold.


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