The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Sep. 24, 2020
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

David L Aronstein, Rochester, NY (US);

Katherine Nicole Ballman, Fairport, NY (US);

Christopher Alan Lee, Pittsford, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/40 (2017.01); G06T 17/30 (2006.01); G06V 10/46 (2022.01); G03F 1/22 (2012.01); G03F 1/82 (2012.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G03F 1/22 (2013.01); G03F 1/82 (2013.01); G06T 7/40 (2013.01); G06T 17/30 (2013.01); G06V 10/473 (2022.01); G06T 2207/30148 (2013.01);
Abstract

Devices, systems, and methods of generating and providing a target topographic map for finishing a photomask blank are disclosed. A method includes receiving topographic data corresponding to an uncompleted photomask blank, receiving functional specifications for flatness of an acceptable photomask blank, and generating the target topographic map for first and/or second major surfaces of the blank, which provides instructions for removing material from the first and/or second major surfaces such that the first and second major surfaces achieve a flatness that passes each functional specification. The amount of material removed reflects a reduction in material necessary to pass the functional specifications. The method further includes transmitting the target topographic map to the finishing device to utilize a finishing technique to implement changes to the photomask blank according to the target topographic map by removing the material from the photomask blank to achieve a photomask blank that passes the functional specifications.


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