The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Nov. 20, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yuan He, Boise, ID (US);

Jiyun Li, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06K 9/62 (2022.01); G06F 1/12 (2006.01); G06F 1/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/10 (2013.01); G06F 1/10 (2013.01); G06F 1/12 (2013.01); G06K 9/6288 (2013.01);
Abstract

Methods, apparatuses, and systems related to an apparatus are described. The apparatus may include (1) a fuse array configured to provide non-volatile storage of fuse data and (2) local latches configured to store the fuse data during runtime of the apparatus. The apparatus may further include an error processing circuit configured to determine error detection-correction data for the fuse data. The apparatus may subsequently broadcast data stored in the local latches to the error processing circuit to determine, using the error detection-correction data, whether the locally latched data has been corrupted. The error processing circuit may generate corrected data to replace the locally latched data based on determining corruption in the locally latched data.


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