The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Jul. 14, 2020
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Genki Kinugasa, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/223 (2006.01); G01M 3/02 (2006.01); G01N 23/2204 (2018.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01M 3/02 (2013.01); G01N 23/2204 (2013.01); G01N 2223/076 (2013.01); G01N 2223/507 (2013.01);
Abstract
An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.