The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Feb. 09, 2021
Vmware, Inc., Palo Alto, CA (US);
Haoran Chen, Beijing, CN;
Xi Cheng, Beijing, CN;
Caixia Jiang, Beijing, CN;
Jingchun Jiang, Beijing, CN;
Feng Pan, Beijing, CN;
VMWARE, INC., Palo Alto, CA (US);
Abstract
Example methods and systems for logical overlay tunnel monitoring are described. One example may involve a first computer system obtaining control information identifying a list of multiple logical overlay tunnels to be monitored, including a first logical overlay tunnel between a first virtual tunnel endpoint (VTEP) and a second VTEP. Based on the control information, a first monitoring agent may configure and inject a probe packet at the first VTEP to cause the first VTEP to perform encapsulation and send an encapsulated probe packet over the first logical overlay tunnel. In response, an encapsulated response packet that includes a response packet may be received from the second monitoring agent over the first logical overlay tunnel. Based on the response packet, a tunnel performance metric associated with the first logical overlay tunnel may be determined.