The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Aug. 05, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Saeed Sharifi Tehrani, San Diego, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/12 (2006.01); G11C 16/10 (2006.01); G11C 7/10 (2006.01); G11C 7/20 (2006.01);
U.S. Cl.
CPC ...
G11C 29/4401 (2013.01); G11C 7/1063 (2013.01); G11C 7/20 (2013.01); G11C 16/102 (2013.01); G11C 29/12005 (2013.01); G11C 29/12015 (2013.01);
Abstract

Technologies for performing a quick reliability scan include, for a particular block of a set of blocks of different block types. Each block of the set of blocks includes pages of memory of a physical memory device. A subset of the pages of the block is identified. The block is scanned by scanning the subset of the plurality of pages of the block for a fold condition. A page of the subset of the plurality of pages is determined to have the fold condition. After the set of blocks has been scanned, the folding of the block that includes the page that has been determined to have the fold condition is requested.


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