The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Dec. 02, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Toyohisa Tsuruda, Kumamoto, JP;

Yusuke Yoda, Tokyo, JP;

Masato Hosaka, Kumamoto, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/50 (2017.01); G06F 30/398 (2020.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06F 30/398 (2020.01); G06T 7/0006 (2013.01); G06T 7/90 (2017.01); G06T 2207/30148 (2013.01);
Abstract

An apparatus includes: a processed-image acquisition part for acquiring a processed image including image information of a surface of a substrate having a target film formed thereon; an estimation part for estimating a shape characteristic value of the target film, by applying an estimation model for estimating the shape characteristic value of the target film to the processed image; an underlying influence model creation part for creating an underlying influence model associated with a correlation between a difference between an estimation result of the shape characteristic value of the target film and a shape characteristic value of the target film acquired without using the estimation model, and information related to a color of a surface of an underlying substrate before the target film is formed, and an estimated-result correction part for correcting the estimation result of the shape characteristic value of the target film based on the underlying influence model.


Find Patent Forward Citations

Loading…