The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Nov. 22, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Richard C. Johnson, Selkirk, NY (US);

Hao Tang, Slingerlands, NY (US);

Yongan Xu, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); G03F 7/30 (2006.01); G03F 7/20 (2006.01); B05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); G03F 7/3021 (2013.01); G03F 7/3028 (2013.01); G03F 7/70 (2013.01); B05D 1/005 (2013.01); G05B 2219/45031 (2013.01);
Abstract

Embodiments of the invention include methods and structures for controlling developer critical dimension (DCD) variations across a wafer surface. Aspects of the invention include an apparatus having developer tubing and an internal cam. The internal cam is coupled to a fixed axis. A flexible divider is positioned between the developer tubing and the internal cam. The flexible divider is coupled to the internal cam such that rotation of the internal cam about the fixed axis is operable to change an inner diameter of the developer tubing.


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