The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Apr. 10, 2020
Rigaku Corporation, Akishima, JP;
Yoshihiro Takeda, Kokubunji, JP;
RIGAKU CORPORATION, Akishima, JP;
Abstract
There is provided an acquiring method of a projection image of a sample whose shape is uneven with respect to a rotation center, the method comprising the steps of setting the sample Sat a position of the rotation center Cprovided between an X-ray sourceand a detector, and acquiring the projection image of the sample Sat each different rotation angle for each different magnification ratio over a rotation angle of 180° or more by rotating the sample Saround the rotation center C, and by relatively changing a separation distance between the X-ray source and the rotation center, or a separation distance between the rotation center and the detector in an optical axis direction according to the shape of the sample Sand the rotation angle of the sample S