The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Apr. 10, 2018
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Stefan Kluckner, Berlin, DE;
Patrick Wissmann, Munich, DE;
Yao-Jen Chang, Princeton, NJ (US);
Terrence Chen, Princeton, NJ (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
A method of characterizing a serum and plasma portion of a specimen in regions occluded by one or more labels. The characterization method may be used to provide input to an HILN (H, I, and/or L, or N) detection method. The characterization method includes capturing one or more images of a labeled specimen container including a serum or plasma portion from multiple viewpoints, processing the one or more images to provide segmentation data including identification of a label-containing region, determining a closest label match of the label-containing region to a reference label configuration selected from a reference label configuration database, and generating a combined representation based on the segmentation information and the closest label match. Using the combined representation allows for compensation of the light blocking effects of the label-containing region. Quality check modules and testing apparatus and adapted to carry out the method are described, as are other aspects.