The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Nov. 17, 2020
Applicant:
Mitutoyo Corporation, Kanagawa, JP;
Inventors:
Koji Shinza, Kanagawa, JP;
Fumihiko Koshimizu, Kanagawa, JP;
Assignee:
MITUTOYO CORPORATION, Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/16 (2006.01); G01N 3/02 (2006.01); G06T 7/00 (2017.01); G01N 3/42 (2006.01); G06V 20/20 (2022.01);
U.S. Cl.
CPC ...
G01N 3/165 (2013.01); G01N 3/02 (2013.01); G06T 7/0004 (2013.01); G01N 3/42 (2013.01); G01N 2203/008 (2013.01); G01N 2203/0019 (2013.01); G01N 2203/0037 (2013.01); G01N 2203/0078 (2013.01); G01N 2203/0252 (2013.01); G06T 7/0008 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30136 (2013.01); G06V 20/20 (2022.01);
Abstract
A hardness tester includes an image acquirer (controller) acquiring an image of a surface (surface image) of a sample captured by an image capturer, an identifier (controller) identifying, based on the surface image of the sample, a non-conformity region inside the image that is unsuitable for the hardness test using predetermined conditions, and a test position definer (controller) defining a test position in an area outside the non-conformity region identified by the identifier.