The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Oct. 02, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Rishikesh Ranade, Bridgeville, PA (US);

Jay Pathak, Pleasanton, CA (US);

Assignee:

ANSYS, INC., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2022.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06V 20/64 (2022.01); G06K 9/628 (2013.01); G06K 9/6256 (2013.01);
Abstract

A method and apparatus for determining spatial characteristics of three-dimensional objects is described. In an exemplary embodiment, the device receives a point cloud representation of a three-dimensional surface structure of a plurality of objects. The device may further generate a set of bins to represent the three-dimensional surface structure based on the point cloud representation, each bin corresponding to a spatial occupancy related to the point cloud representation, each bin including a respective type indicating a spatial relationship of the surface structures and a corresponding spatial occupancy of the bin. In addition, the device may encode the set of bins using a convolutional neural network. The device may further determine a classification for the spatial characteristic of the surface structures based on the convolutional neural network with the encoded set of bins.


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