The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Jun. 08, 2020
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Franz Rottner, Böblingen, DE;

Martin Fischer, Böblingen, DE;

Alois Thalmaier, Böblingen, DE;

Rudi Bauer, Böblingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 1/02 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31721 (2013.01); G01R 31/2834 (2013.01);
Abstract

A power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is triggered in response to an expected load change. An Automated test equipment for testing a device under test comprises a power supply, which is configured to supply the device under test. The automated test equipment comprises a pattern generator configured to provide one or more stimulus signals for the device under test. The power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is activated in synchronism with one or more of the stimulus signals and/or in response to one or more response data signals from the device under test. Corresponding methods and a computer program are also described.


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