The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jan. 06, 2021
Arcsecond, Inc., San Diego, CA (US);
Vaidyanathan P. Ramasarma, San Diego, CA (US);
Adam Varga, Csetény, HU;
Jozsef Petenyi, San Diego, CA (US);
Bence Jozsef Borbely, Budapest, HU;
Ferenc Plutzer, Veszprém, HU;
Daniel Banyay, Budapest, HU;
Ali A. Hashemi, Dubai, AE;
ARCSECOND, INC., San Diego, CA (US);
Abstract
Methods and systems for monitoring and measuring form. A form analysis system can include a flexible garment, a sensor array including two or more sensors positioned on portions of the garment such that at least two of the two or more sensors are positioned on garment such that they align with body parts of the wearer of the garment that are separated by a joint, a harness coupled to the sensor array, the harness having stretchable wiring for communicating signals generated by the sensor array, and a hub coupled to the harness and configured to receive signals from the sensor array, the hub including a transmitter to transmit received signals to a base station.