The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Aug. 13, 2020
Applicant:
Rigaku Corporation, Akishima, JP;
Inventor:
Koichiro Ito, Tokyo, JP;
Assignee:
RIGAKU CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20025 (2018.01); G01N 23/207 (2018.01); G01N 23/2204 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20025 (2013.01); G01N 23/207 (2013.01); G01N 23/2204 (2013.01); G01N 2223/056 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/309 (2013.01);
Abstract
A sample holder () filled with a sample is held in a base member (), and an airtight member () is mounted on the base member () so as to cover the surroundings of the sample holder (), thereby forming a sample holding structure in a closed space. The airtight member () includes a fitting portion () which is configured to be fitted and mounted in a mounting portion ().
Quick Actions:
Ito, Koichiro. (2022). Sample holding device for x-ray analysis (U.S. Patent No. 11525790). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11525790
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile