The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Oct. 30, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Gianni S. Alsasua, Rancho Cordova, CA (US);

Harish R. Singidi, Fremont, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/10 (2006.01); G06F 12/0882 (2016.01); G06F 12/02 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G06F 11/076 (2013.01); G06F 11/3037 (2013.01); G06F 12/0246 (2013.01); G06F 12/0882 (2013.01); G11C 29/10 (2013.01); G11C 29/44 (2013.01);
Abstract

A first scan operation of a set of memory pages of a data block is performed using a first reliability threshold level to identify a set of scan results. A workload type associated with the data block is determined based on the set of scan results. The first reliability threshold level is adjusted to a second reliability threshold level based on the workload type. A second scan operation of the set of memory pages of the data block is performed using the second reliability threshold level.


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