The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2022
Filed:
Apr. 30, 2020
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Skyler Jonathon Saleh, San Diego, CA (US);
Chen Huang, San Diego, CA (US);
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Abstract
A technique for performing a ray intersection test, the method comprising: receiving a request for an early termination ray intersection test for a ray; testing the ray against one or more early termination box nodes and one or more normal box nodes of a bounding volume hierarchy; and based on the test of the ray against the one or more early termination box nodes, determining whether to end traversal of the bounding volume hierarchy and determine whether the ray intersects geometry for the purpose of the ray intersection test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile