The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2022

Filed:

Mar. 23, 2021
Applicant:

United States of Americas As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

Harold A. Haldren, Silver Spring, MD (US);

Daniel F. Perey, Yorktown, VA (US);

William T. Yost, Suffolk, VA (US);

K. Elliott Cramer, Yorktown, VA (US);

Mool C. Gupta, Keswick, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/44 (2013.01); G01N 2291/014 (2013.01); G01N 2291/044 (2013.01); G01N 2291/102 (2013.01);
Abstract

A method and system for ultrasonic testing of adhesion within a sample, which provides ultrasonic bursts of different frequencies to the sample and maintains a predetermined phase difference between echoes returned from the sample and representative reference signals of the bursts supplied to the sample until a spectrum of the phase differences versus frequency is obtained and from which properties of the adhesion at an interface reflecting the echoes are derivable.


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