The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Jul. 03, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rachel Brill, Haifa, IL;

Eitan Farchi, Pardes-Hana, IL;

Orna Raz, Haifa, IL;

Aviad Zlotnick, Mitzpeh-Netofa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06K 9/62 (2022.01); G06N 20/10 (2019.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/6227 (2013.01); G06K 9/6262 (2013.01); G06N 3/02 (2013.01); G06N 20/10 (2019.01);
Abstract

A method, apparatus and a computer program product for automated data slicing based on an Artificial Neural Network (ANN). The method comprising: obtaining an ANN, wherein the ANN is configured to provide a prediction for a data instance, wherein the ANN comprises a set of nodes having interconnections therebetween; determining an attribute vector based on a subset of the nodes of the ANN; determining, based on the attribute vector, a plurality of data slices; obtaining a testing dataset comprising testing data instances; computing, for each data slice, a performance measurement of the ANN over the data slice, wherein said computing is based on an application of the ANN on each testing data instance that is mapped to the data slice; and performing an action based on at least a portion of the performance measurements of the data slices.


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