The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

May. 01, 2020
Applicant:

Intrinsic Innovation Llc, Mountain View, CA (US);

Inventors:

Timothy Robert Kelch, San Jose, CA (US);

Ryan Butterfoss, San Francisco, CA (US);

Assignee:

Intrinsic Innovation LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1661 (2013.01); B25J 9/1692 (2013.01); B25J 13/089 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for modifying a process definition to ensure accuracy, timeliness, or both of workcell measurement. One of the methods includes receiving an initial process definition for a process to be performed by a robot, wherein the process definition defines a sequence of actions to be performed in a workcell, and wherein a first action in the sequence of actions has an associated measurement tolerance; computing a predicted accumulated measurement variance for each of one or more actions that occur before the first action in the sequence; determining that the predicted accumulated measurement variance for the one or more actions that occur before the first action in the sequence exceeds a threshold; and in response, generating a modified process definition that inserts a measurement action at a location in the sequence before the first action.


Find Patent Forward Citations

Loading…