The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Jun. 28, 2019
Intel Corporation, Santa Clara, CA (US);
Wei-Yu Tsai, Chandler, AZ (US);
Amit Aneja, Chandler, AZ (US);
Maciej Adam Kaminski, Chandler, AZ (US);
Dhawal Srivastava, Scottsdale, AZ (US);
Jayaram Puttaswamy, Bellevue, WA (US);
Mithali Shivkumar, Chandler, AZ (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Input images are partitioned into non-overlapping segments perpendicular to a disparity dimension of the input images. Each segment includes a contiguous region of pixels spanning from a first edge to a second edge of the image, with the two edges parallel to the disparity dimension. In some aspects, contiguous input image segments are assigned in a 'round robin' manner to a set of sub-images. Each pair of input images generates a corresponding pair of sub-image sets. Semi-global matching processes are then performed on pairs of corresponding sub-images generated from each input image. The SGM processes may be run in parallel, reducing an elapsed time to generate respective disparity sub-maps. The disparity sub-maps are then combined to provide a single disparity map of equivalent size to the original two input images.