The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
May. 25, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Alexander Freytag, Erfurt, DE;
Christian Kungel, Penzberg, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
In a computer-implemented method for generating an image processing model that generates output data defining a stylized contrast image from a microscope image, model parameters of the image processing model are adjusted by optimizing at least one objective function using training data. The training data comprises microscope images as input data and contrast images, wherein the microscope images and the contrast images are generated by different microscopy techniques. In order for the output data to define a stylized contrast image, the objective function forces a detail reduction or the contrast images are detail-reduced contrast images with a level of detail that is lower than in the microscope images and higher than in binary images.