The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Jun. 16, 2021
Mitutoyo Corporation, Kanagawa, JP;
Mitutoyo Europe Gmbh, Neuss, DE;
Till Martin Bruckdorfer, Schramberg, DE;
MITUTOYO CORPORATION, Kanagawa, JP;
MITUTOYO EUROPE GMBH, Neuss, DE;
Abstract
A method for filtering a measurement data set usable for specifying and/or verifying an internal feature of a workpiece, the method includes providing a measurement data set comprising a plurality of measurement points of the internal feature; providing an auxiliary feature representing an ideal estimate for the internal feature of the workpiece; mirroring each measurement point of the measurement data set on a boundary element of the auxiliary feature, thereby generating a first modified data set comprising a plurality of first modified measurement points; determining a convex hull of the first modified measurement points and projecting the first modified measurement points onto the determined convex hull, thereby generating a second modified data set comprising a plurality of second modified measurement points; and mirroring each second modified measurement point on the boundary element of the auxiliary feature, thereby generating a filtered measurement data set comprising a plurality of filtered measurement points.