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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11500004 B1

PDFFull Text
Date of Patent:
Nov. 15, 2022

Filed:

May. 17, 2021

Test apparatus and test method

Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Tomohiko Maruo, Kanagawa, JP;

Hiroyuki Baba, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:

Pearne & Gordon LLP

Primary Examiner:

Tho G Phan

Int. Cl.
CPC ...
H01Q 15/14 (2006.01); G01R 29/10 (2006.01); H04B 17/00 (2015.01); H04B 17/15 (2015.01); H01Q 15/16 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/0821 (2013.01); H01Q 15/16 (2013.01);
Abstract

A test apparatus includes a test antenna that is provided in an OTA chamberand transmits or receives a radio signal to or from an antennaof a DUT, and a measurement device that measures transmission characteristics or reception characteristics of the DUTdisposed in a quiet zone QZ, by using the test antenna. The test antenna includes a reflector reflection type test antennathat transmits or receives a radio signal to or from the antennaof the DUT via a reflector, and mirror reflection type test antennae, andthat transmits or receives a radio signal to or from the antennaof the DUT via mirrorsto

Find Patent Forward Citations

Maruo, Tomohiko. (2022). Test apparatus and test method (U.S. Patent No. 11500004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11500004

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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