The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Sep. 28, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Jeffrey Baker, El Dorado Hills, CA (US);

Daniel Pohl, Puchheim, DE;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/58 (2022.01); B60W 30/16 (2020.01); H04W 4/46 (2018.01); B60W 40/09 (2012.01); B60W 40/04 (2006.01);
U.S. Cl.
CPC ...
G06V 20/58 (2022.01); B60W 30/16 (2013.01); B60W 40/04 (2013.01); B60W 40/09 (2013.01); H04W 4/46 (2018.02);
Abstract

According to various aspects, an obstacle analyzer may include: one or more sensors configured to receive obstacle identification information representing one or more identification features of an obstacle and obstacle condition information associated with one or more conditions of the obstacle; and one or more processors configured to identify the obstacle based on the received obstacle identification information and generate an identification value corresponding to the identified obstacle, determine a rating value representing a risk potential of the identified obstacle based on the received obstacle condition information, and store the rating value assigned to the identification value of the identified obstacle in one or more memories.


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