The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Aug. 05, 2020
Applicant:

Advantest Test Solutions, Inc., San Jose, CA (US);

Inventors:

Karthik Ranganathan, San Jose, CA (US);

Gregory Cruzan, San Jose, CA (US);

Samer Kabbani, San Jose, CA (US);

Gilberto Oseguera, San Jose, CA (US);

Rohan Gupte, San Jose, CA (US);

Homayoun Rezai, San Jose, CA (US);

Kenneth Santiago, San Jose, CA (US);

Marc Ghazvini, San Jose, CA (US);

Assignee:

ADVANTEST TEST SOLUTIONS, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/319 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2844 (2013.01); G01R 31/2863 (2013.01); G01R 31/2875 (2013.01); G01R 31/2877 (2013.01); G01R 31/31713 (2013.01); G01R 31/31905 (2013.01);
Abstract

A testing apparatus comprises a test interface board comprising a plurality of socket interface boards, wherein each socket interface board comprises: a) an open socket to hold a DUT; b) a discrete active thermal interposer comprising thermal properties and operable to make thermal contact with the DUT; c) a superstructure operable to contain the discrete active thermal interposer; and d) an actuation mechanism operable to provide a contact force to bring the discrete active thermal interposer in contact with the DUT.


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