The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Aug. 13, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kosuke Suzuki, Tokyo, JP;

Fujio Onishi, Tokyo, JP;

Hidetsugu Tanoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/01 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G01N 35/00584 (2013.01); G01N 2021/0118 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/00891 (2013.01); G01N 2035/1048 (2013.01);
Abstract

Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.


Find Patent Forward Citations

Loading…