The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Jun. 17, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Yasuhiro Hidaka, Fujisawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); G02B 5/30 (2006.01); G02B 27/28 (2006.01); G01N 21/21 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02043 (2013.01); G01B 9/02084 (2013.01); G01B 11/0641 (2013.01); G01N 21/211 (2013.01); G02B 5/3025 (2013.01); G02B 27/283 (2013.01); G02B 27/288 (2013.01); G01B 2290/70 (2013.01);
Abstract

An ellipsometer includes a first separation unit configured to separate a first reflected light into two reflected lights, a first polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, a first interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other, a second separation unit configured to separate a second reflected light into two reflected lights, a second polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, and a second interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other.


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